Peer-reviewed publications

D. J. Chang*, C. M. O'Leary*, C. Su, S. Kahn, A. Zettl, J. Ciston, P. Ercius and J. Miao, “Deep-Learning Electron Diffractive Imaging”, Physical Review Letters, vol. 130, p. 016101, 2023. (Link to article)
A. Rana, C.-T. Liao, E. Iacocca, J. Zou, M. Pham, X. Lu, E.-E. Cating Subramanian, Y. H. Lo, S. A. Ryan, C. S. Bevis, R. M. Karl Jr, A. J. Glaid, J. Rable, P. Mahale, J. Hirst, T. Ostler, W. Liu, C. M. O’Leary, Y.-S. Yu, K. Bustillo, H. Ohldag, D. A. Shapiro, S. Yazdi, T. E. Mallouk, S. J. Osher, H. C. Kapteyn, V. H. Crespi, J. V. Badding, Y. Tserkovnyak, M. M. Murnane and J. Miao, “Creation and observation of topological magnetic monopoles and their interactions in a ferromagnetic meta-lattice”, Nature Nanotechnology, vol. 18, pp. 227–232 (2023). (Link to article)
L. Clark, G. T. Martinez, C. M. O'Leary, H. Yang, T. C. Petersen, S. D. Findlay and P. D. Nellist, “The effect of dynamical scattering on single-plane phase retrieval in electron ptychography”, Microscopy and Microanalysis, vol. 29, no. 1, pp. 384-394 , 2023. (Link to article)
C. M. O’Leary*, B. Haas*, C. T. Koch, P. D. Nellist and L. Jones, “Increasing Spatial Fidelity and SNR of 4D-STEM using Multi-Frame Data Fusion”, Microscopy and Microanalysis, vol. 28, no. 4, pp, 1417-142, 2022. (Link to article)
W. Song, M. A. Pérez-Osorio, J. -J. Marie, E. Liberti, X. Luo, C. M. O’Leary, R. A. House, P. G. Bruce and P. D. Nellist, “Direct imaging of oxygen shifts associated with the oxygen redox of Li-rich layered oxides”, Joule, vol. 6, no. 5, pp. 1049-1065, 2022. (Link to article)
C. M. O’Leary, G. T. Martinez, E. Liberti, M. J. Humphry, A. I. Kirkland and P. D. Nellist, “Contrast transfer and noise considerations in focused-probe electron ptychography”, Ultramicroscopy, vol. 221, p. 113189, 2021. (Link to article)
C. M. O’Leary, C. S. Allen, C. Huang, J. S. Kim, E. Liberti, P. D. Nellist, and A. I. Kirkland, “Phase reconstruction using fast binary 4D STEM data”, Applied Physics Letters, vol. 116, no. 12, p. 124101, 2020. (Link to article)
M. U. Rothmann, J. S. Kim, J. Borchert, K. B. Lohmann, C. M. O’Leary, A. A. Sheader, L. Clark et al., “Atomic-scale microstructure of metal halide perovskite”, Science, vol. 370, no. 6516, 2020. (Link to article)
T. Chen, I. Ellis, T. J. N. Hooper, E. Liberti, L. Ye, B. T. W. Lo, C. M. O’Leary et al., “Interstitial Boron Atoms in the Palladium Lattice of an Industrial Type of Nanocatalyst: Properties and Structural Modifications”, Journal of the American Chemical Society, vol. 141, no. 50, pp. 19616-19624, 2019. (Link to article)
J. Fatermans, A. J. den Dekker, K. Müller-Caspary, I. Lobato, C. M. O’Leary, P. D. Nellist and S. Van Aert, “Single Atom Detection from Low Contrast-to-Noise Ratio Electron Microscopy Images”, Physical Review Letters, vol. 125, no. 5, p. 056101, 2018. (Link to article)

Pre-prints

C. M. O'Leary, J. Zhang, C. Su, S. Kahn, H. Jiang, A. Zettl, J. Ciston and Jianwei Miao, “Three-dimensional imaging of embedded interfaces with multislice ptychography”, arXiv:2308.15471 [cond-mat.mtrl-sci], 2023. (Link to pre-print)
G. T. Martinez, T. C. Naginey, L. Jones, C. M. O'Leary, T. J. Pennycook, R. J. Nicholls, J. R. Yates and P. D. Nellist, “Direct imaging of charge redistribution due to bonding at atomic resolution via electron ptychography”, arXiv:1907.12974 [cond-mat.mtrl-sci], 2019. (Link to pre-print)

Conference proceedings

C. M O’Leary, D. J. Chang, P. Ercius, P. D. Nellist, A. I. Kirkland and J. Miao, “Confessions of a Ptychopath: Detection, Dimensions, Damage and Despair”, Microscopy and Microanalysis, vol. 29, no. S1, pp. 432-433, 2023. (Link to abstract)
M. Zachman, C. M. O’Leary, D. Y. Chung, H. Hafiz, E. F. Holby, V. Stamenkovic and D. Cullen, “Atomic-scale Imaging of PGM-free Catalyst Active Sites by 30 keV 4D-STEM”, Microscopy and Microanalysis, vol. 27, no. S1, pp. 2976-2977, 2021. (Link to abstract)
C. O'Leary, E. Liberti, G. Martinez, C. Allen, C. Huang, M. Rothmann, H. Luo, J. Kim, L. Herz, H. Assender and L. Jones, “Focused-probe STEM Ptychography: Developments and Opportunities”. Microscopy and Microanalysis, vol. 26, no. S2, pp. 470-471, 2020. (Link to abstract)
C. M. O'Leary, E. Liberti, S. M. Collins, D. N. Johnstone, M. Rothmann, J. Hou, C. S. Allen, J. S. Kim, T. D. Bennett, P. A. Midgley, A. I. Kirkland and P. D. Nellist, “Electron Ptychography Using Fast Binary 4D STEM Data”, Microscopy and Microanalysis, vol. 25, no. S2, pp. 1662-1663, 2019. (Link to abstract)
C. M. O'Leary, G. T. Martinez, E. Liberti, M. J. Humphry, A. I. Kirkland and P. D. Nellist, “Contrast Transfer and Noise Minimization in Electron Ptychography”, Microscopy and Microanalysis, vol. 25, no. S2, pp. 64-65, 2019. (Link to abstract)
M. Huth, R. Ritz, C. M. O'Leary, I. Griffiths, P. Nellist, and H. Soltau, “Ultrafast Ptychography with 7500 Frames per Second”, Microscopy and Microanalysis, vol. 25, no. S2, pp. 40-41, 2019. (Link to abstract)
E. Liberti, G. T. Martinez, C. M. O'Leary, P. D. Nellist, and A. I. Kirkland, “Three-dimensional Electron Ptychography of Catalyst Nanoparticles using Combined HAADF STEM and Atom Counting”, Microscopy and Microanalysis, vol. 25, no. S2, pp. 8-9, 2019. (Link to abstract)
T. J. Pennycook, G. T. Martinez, C. M. O'Leary, H. Yang, and P. D. Nellist, “Efficient Phase Contrast Imaging via Electron Ptychography, a Tutorial”, Microscopy and Microanalysis, vol. 25, no. S2, pp. 2684-2685, 2019. (Link to abstract)
P. D. Nellist, G. T. Martinez, C. O'Leary, and L. Jones, “Exploring the Limits of Focused-Probe STEM Ptychography”, Microscopy and Microanalysis, vol. 24, no. S1, pp. 190-191, 2018. (Link to abstract)

Thesis

C. O’Leary, The development and applications of STEM ptychography using direct electron detectors, University of Oxford, 2020. (Link to thesis)

Technical reports

C. O’Leary* et al., “Research Collaborations: A guide for early career researchers by early career researchers”, League of European Research Universities (LERU) Graduate Summer School, 2019. (Link to report)

Invited talks

Confessions of a Ptychopath: Detectors, Dimensions, Damage and Despair
- Jul 2023: Microscopy and Microanalysis Conference, Minneapolis, Minnesota, USA.

Focused-Probe STEM Ptychography: Developments and Opportunities
- Aug 2020: Microscopy and Microanalysis (Virtual) Conference, USA. (Link to abstract)

Electron Ptychography: Maximizing Contrast While Minimizing Dose
- Sep 2019: Oak Ridge National Laboratory, Tennessee, USA.
- Sep 2019: Max Planck Institute for Solid State Research, Stuttgart, Germany.
- Aug 2019: Molecular Foundry, Lawrence Berkeley National Laboratory, California, USA.

Focused-Probe Electron Ptychography
- Nov 2018: School of Physics, Trinity College Dublin, Ireland.