Three-dimensional imaging of individual carbon atoms (Nature Nanotechnology, Accepted)
I co-developed a pipeline to accurately determine the position of individual atoms in twisted bilayer graphene using ptychographic atomic electron tomography (pAET), revealing morphological textures that could not be observed with conventional imaging techniques.
3D structure of buried interfaces in quantum materials (PR Applied)
I performed multislice electron ptychography, a powerful computational 3D imaging technique, to visualize the structure of a twisted hBN heterointerface. The results were acquired without tilting the sample, thus removing the geometric constraints typically incurred when performing electron tomography.
Accurate determination of the 3D atomic structure of amorphous materials (Nature)
I co-developed a workflow to determine the atomic coordinates of amorphous nanoparticles using atomic electron tomography (AET). This is the only method capable of experimentally determining the 3D atomic structure of disordered materials, and thus requires rigorous validation methods to faithfully represent the structure.
Phase reconstruction using fast binary 4D STEM data (APL)
I demonstrated the first example 1-bit ptychography (i.e. the detector can only count '0' or '1'). This resulted in a tenfold increase in acquisition speed, enabling atomic-resolution imaging of radiaton-sensitive materials.
Contrast transfer and noise in ptychography (Ultramicroscopy)
I explored the theory, experiment and computation of image contrast mechanisms in electron ptychography, to understand how to design experiments which optimize atomic-resolution imaging.
Multi-frame 4D-STEM and ptychography (M&M)
I demonstrated the first example of multiframe electron ptychography, where multiple data sets can be aligned and summed to increase signal to noise ratio and spatial fidelity.
Invited talk on focused-probe STEM ptychography (M&M, 2020)
In 2020 and 2023, I was invited to give a virtual oral presentation at Microscopy and Microanalysis: the largest microscopy conference in the US.
STEM diffraction patterns from a thick crystal
A series of convergent beam electron diffraction (CBED) patterns acquired from a zeolite sample using four-dimensional scanning transmission electron microscopy (4D-STEM).
In 2021 and 2025, I gave pedagogical lectures on advanced microscopy techniques to STROBE: a NSF Science and Technology Center focused on developing the fields of optical, X-ray and electron microscopy.